Please select an Excel (.xls; .xlsx) or CSV file (.txt; .csv; .tab):
Reset shopping basket prior to importing:
The first line contains labels; ignore them:
Number of the column with the article number:
Number of the column with the quantity:
Separation characters (relevant for *.csv files):
Export on Demand

Microscope Unit for Semiconductor Inspection

  • Excellent operability with the optional inward rotating turret and high quality objective lenses with long working distance.
  • Ideal as the microscope unit of a prober station for semiconductors.
  • The L- and L4-models support YAG laser wavelength ranges from 266 up to 1064 nm allowing laser cutting of thin films and liquid crystal substrates.
  • Ergonomic design with combined knob for coarse- and enlarged fine focus adjustment.
1 - 5 (16)Results per page:
378-185_z.eps
FS70
Price on application
378-185_z.eps
FS70S
Price on application
378-185_z.eps
FS70TH
Price on application
378-185_z.eps
FS70THS
Price on application
378-185_z.eps
FS70Z
Price on application
*VAT excluded. All products are intended to be sold to commercial customers.