Series 378 - Microscope Unit for Semiconductor Inspection

  • Excellent operability with the inward rotating turret and high quality objective lenses with long working distance.
  • Ideal as the microscope unit of a prober station for semiconductors.
  • The L- and L4-models support YAG laser wavelength ranges from 266 up to 1064 nm allowing laser cutting of thin films and liquid crystal substrates.
  • Ergonomic design with combined knob for coarse- and enlarged fine focus adjustment.


1 - 5 (16)Number:
378_185_z_eps
FS70
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FS70
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378_185_z_eps
FS70S
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FS70S
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378_185_z_eps
FS70TH
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FS70TH
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378_185_z_eps
FS70THS
Price on application
FS70THS
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378_185_z_eps
FS70Z
Price on application
FS70Z
Price on application
1 - 5 (16)
*VAT excluded. All products are intended to be sold to commercial customers.